New scanning probe microscopy techniques for analyzing organic photovoltaic materials and devices
<img hspace="10" vspace="5" align="left" width="110" src="http://www.powersavestore.com/wp-content/plugins/wp-o-matic/cache/0ee38_1332-new-scanning-probe-microscopy-techniques-for-analyzing-organic-photovoltaic-materials-and-devices.jpg” /> Rajiv GiridharagopaL, Guozheng Shao, David S. Ginger,
University of Washington; and Chris Groves, Durham University,discuss the experimental challenges and opportunities associated with two different AFM-based optoelectronic scanning probe techniques, photoconductive AFM (pcAFM) and time-resolved electrostatic force microscopy (trEFM), that have been used help understand how morphology impacts organic photovoltaic (OPV) performance.
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